Microelectronics Reliability
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* Dữ liệu chỉ mang tính chất tham khảo
Sắp xếp:
A discrete time queueing problem with S heterogeneous groups of channels
Microelectronics Reliability - Tập 25 - Trang 455-459 - 1985
Reliability of Pb(Mg,Nb)O3–Pb(Zr,Ti)O3 multilayer ceramic piezoelectric actuators by Weibull method
Microelectronics Reliability - Tập 46 - Trang 183-188 - 2006
A research study of environmental factors for the gamma distribution
Microelectronics Reliability - Tập 32 - Trang 331-335 - 1992
A simple method for optimal redundancy allocation for complex networks
Microelectronics Reliability - Tập 27 - Trang 835-837 - 1987
Interface microstructure effects in Au thermosonic ball bonding contacts by high reliability wire materials
Microelectronics Reliability - Tập 54 - Trang 2000-2005 - 2014
A full-field warpage characterization measurement method coupled with infrared information
Microelectronics Reliability - Tập 149 - Trang 115237 - 2023
Electrical stress effect on RF power characteristics of SiGe hetero-junction bipolar transistors
Microelectronics Reliability - Tập 48 - Trang 193-199 - 2008
A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D physically based device simulation
Microelectronics Reliability - Tập 47 - Trang 1800-1805 - 2007
Reliability and maintainability growth of a modern, high performance aircraft, the F-14A
Microelectronics Reliability - Tập 19 - Trang 31-38 - 1979
The surface characteristics of under bump metallurgy (UBM) in electroless nickel immersion gold (ENIG) deposition
Microelectronics Reliability - Tập 46 - Trang 367-379 - 2006
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