Reliability assessment of small signal GaAs FETs

Microelectronics Reliability - Tập 19 - Trang 107-115 - 1979
François Behmann1
1Telesat Canada, Ottawa, Canada

Tài liệu tham khảo

Irie, 1976, Reliability Study of GaAs MESFETs, IEEE Transactions on Microwave Theory and Techniques, Vol. MTT-24, 10.1109/TMTT.1976.1128850 Reynolds, 1974, Thermally Accelerated Aging of Semiconductor Components, Vol. 62 Peck, 1974, The Reliability of Semiconductor Devices in the Bell System, Vol. 62