Packaging influences on the reliability of MEMS resonators

Microelectronics Reliability - Tập 48 - Trang 1567-1571 - 2008
J.J.M. Zaal1, W.D. van Driel1,2, S. Bendida2, Q. Li1, J.T.M. van Beek2, G.Q. Zhang1,2
1Delft University of Technology, Faculty 3ME Department FMS, Mekelweg 2, 2628 CD Delft, The Netherlands
2NXP Semiconductors, Gerstweg 2, 6534 AE Nijmegen, The Netherlands

Tài liệu tham khảo

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