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Springer Science and Business Media LLC

SCOPUS (2018-2023)ESCI-ISI

  2520-811X

  2520-8128

 

Cơ quản chủ quản:  Springer Science + Business Media

Lĩnh vực:
Materials Science (miscellaneous)Mechanical EngineeringIndustrial and Manufacturing Engineering

Các bài báo tiêu biểu

Distance Measurements Using Mode-Locked Lasers: A Review
Tập 1 Số 3 - Trang 131-147 - 2018
Yoon-Soo Jang, Seung-Woo Kim
A New Optical Angle Measurement Method Based on Second Harmonic Generation with a Mode-Locked Femtosecond Laser
- 2019
Hiraku Matsukuma, Shuhei Madokoro, Wijayanti Dwi Astuti, Yuki Shimizu, Wei Gao
Study on Mechanisms of Photon-Induced Material Removal on Silicon at Atomic and Close-to-Atomic Scale
Tập 4 Số 4 - Trang 216-225 - 2021
Peizhi Wang, Jinshi Wang, Fengzhou Fang
AbstractThis paper presents a new approach for material removal on silicon at atomic and close-to-atomic scale assisted by photons. The corresponding mechanisms are also investigated. The proposed approach consists of two sequential steps: surface modification and photon irradiation. The back bonds of silicon atoms are first weakened by the chemisorption of chlorin...... hiện toàn bộ
Investigation on Innovative Dynamic Cutting Force Modelling in Micro-milling and Its Experimental Validation
Tập 1 Số 2 - Trang 82-95 - 2018
Zhichao Niu, Feifei Jiao, Kai Cheng
An Analytical Model for Determining the Shear Angle in 1D Vibration-Assisted Micro Machining
Tập 2 Số 4 - Trang 199-214 - 2019
Shamsul Arefin, Xinquan Zhang, Senthil Kumar Anantharajan, Kui Liu, Dennis Wee Keong Neo
Cutting-Based Single Atomic Layer Removal Mechanism of Monocrystalline Copper: Atomic Sizing Effect
Tập 2 Số 4 - Trang 241-252 - 2019
Wenkun Xie, Fengzhou Fang
Etching Characteristics of Quartz Crystal Wafers Using Argon-Based Atmospheric Pressure CF4 Plasma Stabilized by Ethanol Addition
- 2019
Rongyan Sun, Xu Yang, Keiichiro Watanabe, Shiro Miyazaki, Tohru Fukano, Masanobu Kitada, Kenta Arima, Kentaro Kawai, Kazuya Yamamura
Toward Single-Atomic-Layer Lithography on Highly Oriented Pyrolytic Graphite Surfaces Using AFM-Based Electrochemical Etching
Tập 5 Số 1 - Trang 32-38 - 2022
Wenzhong Han, Paven Thomas Mathew, Srikanth Kolagatla, Brian J. Rodriguez, Fengzhou Fang
AbstractAtomic force microscopy (AFM)-based electrochemical etching of a highly oriented pyrolytic graphite (HOPG) surface is studied toward the single-atomic-layer lithography of intricate patterns. Electrochemical etching is performed in the water meniscus formed between the AFM tip apex and HOPG surface due to a capillary effect under controlled high relative hu...... hiện toàn bộ
Instrumented Indentation Test in the Nano-range: Performances Comparison of Testing Machines Calibration Methods
Tập 2 Số 2 - Trang 91-99 - 2019
Maurizio Galetto, Giacomo Maculotti, Gianfranco Genta, Giulio Barbato, Raffaello Levi
Design and Testing of a Micro-thermal Sensor Probe for Nondestructive Detection of Defects on a Flat Surface
- 2018
Yuki Shimizu, Yasunari Matsuno, Yuan Liu Chen, Hiraku Matsukuma, Wei Gao