Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques

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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques - Tập 1 - Trang 71-75 - 2007
L. G. Shabel’nikov
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Methods for calculating the resonant part of the atomic factor in crystals with partial filling of the crystallographic position
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques - - 2014
K. A. Akimova, A. S. Ilyushin, A. P. Oreshko, E. N. Ovchinnikova
The resonant part of the tensor atomic factor, which is important for incident radiation energies close to the atom absorption edges, is sensitive to the local environment of a scattering atom (near-range order). In this paper, a method for mathematical modeling of the resonant part of the atomic factor is developed by taking into account crystal-lattice relaxation caused by the partial filling of...... hiện toàn bộ
Rapid cementation of steel from a coating under anodic electrolytic heating conditions
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques - Tập 9 - Trang 313-316 - 2015
T. I. Alfereva, P. N. Belkin, A. V. Zhirov
The results of an experimental study of the anodic plasma-electrolytic treatment of steel samples with a graphite coating are presented. The effect of the coating thickness, duration and temperature of the treatment on the thickness, elemental composition, and microhardness of the cemented layer is studied.
Simulation of the Electrical Conductivity in Systems of Carbon Nanotubes
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques - Tập 14 - Trang 1057-1060 - 2020
P. A. Likhomanova, K. Yu. Khromov
A simple and efficient method for calculating the conductivity of systems of carbon nanotubes forming a random resistor circuit in the case where the percolation threshold is reached in the system is proposed in this paper. This method uses the recursive removal of the dead-end branches of a cluster, which is necessary to determine the elements of the percolation cluster participating in the syste...... hiện toàn bộ
Effect of the Substrate Surface Roughness on the Stability of the Parameters of Thin-Film Resistive Elements
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques - Tập 14 - Trang 875-881 - 2020
V. E. Sergeev, V. M. Vorotyntsev, T. S. Sazanova, I. V. Vorotyntsev, S. V. Kononov
In this paper, the effect of the substrate surface roughness on the stability of the parameters of thin-film resistive elements is investigated. The surface roughness of the substrates is determined by optical microscopy and atomic-force microscopy (AFM). A technology is developed to produce a smoothing surface coating based on thin Ta2O5 films with an amorphous coherent structure, the application...... hiện toàn bộ
Investigation of the Effect of Electron-Beam Irradiation on the Defect Structure of Laterally Overgrown GaN Films via the Induced-Current and Cathodoluminescence Methods
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques - Tập 12 Số 5 - Trang 994-999 - 2018
П. С. Вергелес, E. B. Yakimov
Effect of segregation on other physicochemical processes in implanted layers
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques - Tập 6 - Trang 782-783 - 2012
L. K. Izraileva, E. N. Rumanov
The kinetics of the reaction of implanted atoms with the substrate in the presence of a cluster of implanted atoms is considered. It is shown that the reaction rate changes significantly due to cluster formation.
Backscattered electron imaging of micro- and nanostructures: 5. SEM signal formation model
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques - Tập 10 - Trang 892-905 - 2016
Yu. A. Novikov
A semiempirical model describing how images are formed in a scanning electron microscope operating in the backscattered electron collection mode is discussed. The model involves four imaging mechanisms. The model and the experiment are compared for grooves in silicon with rectangular and trapezoidal relief profiles.
Features of the energy distribution of secondary particles upon the ion bombardment of graphite
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques - Tập 7 - Trang 161-167 - 2013
V. V. Khvostov, K. F. Minnebaev, V. E. Yurasova
The secondary emission of carbon atoms from the (0001) plane of graphite nanocrystallites bombarded with argon ions with energies of 1 and 10 keV and the incidence angle α = 45° is investigated. The unusual oscillating energy distributions of secondary C+ ions with main maxima E max in the range of 40–60 eV and peaks corresponding to the energies E 1...... hiện toàn bộ
Study of the properties of a Si surface layer implanted with 64Zn+ and 16O+ ions during the formation of ZnO nanoparticles under thermal annealing
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques - Tập 9 - Trang 486-495 - 2015
V. V. Privezentsev, V. S. Kulikauskas, V. V. Zatekin, D. V. Petrov, A. Yu. Trifonov, A. A. Batrakov
The cross section of a Si surface layer implanted with 64Zn+ and 16O+ ions is visualized via high-resolution transmission electron microscopy, and its evolution as a result of thermal annealing is investigated. The profiles of impurities implanted into this layer, which are measured by means of secondary-ion mass spectrometry, as well as their changes arising from heat treatment, are analyzed. The...... hiện toàn bộ
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