Features of the energy distribution of secondary particles upon the ion bombardment of graphite
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques - Tập 7 - Trang 161-167 - 2013
Tóm tắt
The secondary emission of carbon atoms from the (0001) plane of graphite nanocrystallites bombarded with argon ions with energies of 1 and 10 keV and the incidence angle α = 45° is investigated. The unusual oscillating energy distributions of secondary C+ ions with main maxima E
max in the range of 40–60 eV and peaks corresponding to the energies E
1 ≈ 20, 30, 70, 80, and 100 eV have been revealed. The C+ ion yield decreases, the energy spectrum increases, and the maximum E
max shifts to larger energies E
1 with increasing emission angle (with respect to the normal to the surface). The secondary-ion emission from the (0001) face of graphite is numerically simulated with allowance for the charge exchange of secondary ions to obtain a qualitative explanation of the observed results.
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