Surface and Interface Analysis

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Low‐energy implantation and sputtering of TiO2 by nitrogen and argon and the electrochemical reoxidation
Surface and Interface Analysis - Tập 17 Số 10 - Trang 726-736 - 1991
M. Wolff, J.W. Schultze, Hans‐Henning Strehblow
Analytical TEM study on the dispersion of Au nanoparticles in Au/TiO2 catalyst prepared under various temperatures
Surface and Interface Analysis - Tập 31 Số 2 - Trang 73-78 - 2001
Tomoki Akita, Ping Lü, Satoshi Ichikawa, Koji Tanaka, Masatake Haruta
Quantitative depth profiling in surface analysis: A review
Surface and Interface Analysis - Tập 2 Số 4 - Trang 148-160 - 1980
S. Hofmann
Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis
Surface and Interface Analysis - Tập 3 Số 5 - Trang 211-225 - 1981
C. D. Wagner, Lawrence E. Davis, M. Zeller, J. Ashley Taylor, R. Raymond, Laird H. Gale
Antibacterial metal implant with a TiO2‐conferred photocatalytic bactericidal effect against Staphylococcus aureus
Surface and Interface Analysis - Tập 41 Số 1 - Trang 17-22 - 2009
Koutaro Shiraishi, Hironobu Koseki, Toshiyuki Tsurumoto, K. Baba, Mariko Naito, Koji Nakayama, Hiroyuki Shindo
Investigation of multiplet splitting of Fe 2p XPS spectra and bonding in iron compounds
Surface and Interface Analysis - Tập 36 Số 12 - Trang 1564-1574 - 2004
Andrew P. Grosvenor, Brad Kobe, Mark C. Biesinger, N. S. McIntyre
Characterization of CuInSe2 thin films by XPS
Surface and Interface Analysis - Tập 15 Số 7 - Trang 422-426 - 1990
Esko Niemi, Lars Stolt
X‐ray photoelectron spectroscopic chemical state quantification of mixed nickel metal, oxide and hydroxide systems
Surface and Interface Analysis - Tập 41 Số 4 - Trang 324-332 - 2009
Mark C. Biesinger, Brad P. Payne, Woon‐Ming Lau, Andrea R. Gerson, Roger St. C. Smart
The effect of the H:C ratio on the sputtering of molecular solids by fullerenes
Surface and Interface Analysis - Tập 43 Số 1-2 - Trang 116-119 - 2011
R.P. Webb, Barbara J. Garrison, John C. Vickerman
Strategies for modeling diverse chemical reactions in molecular dynamics simulations of cluster bombardment
Surface and Interface Analysis - Tập 43 Số 1-2 - Trang 126-128 - 2011
Paul E. Kennedy, Barbara J. Garrison, Michael F Russo, Adri C. T. van Duin
Tổng số: 101   
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