Optical Detection of Electron Nuclear Double Resonance on the Residual Donor in GaNSpringer Science and Business Media LLC - Tập 1 - Trang 1-5 - 1996
F. K. Koschnick, K. Michael, J.-M. Spaeth, B. Beaumont, Pierre Gibart
Optically detected electron nuclear double resonance (ODENDOR) was measured in the 2.2 eV ‘yellow’ luminescence band associated with the residual donor in n-type undoped GaN. The ODENDOR lines are due to gallium and show a quadrupole splitting which can be described with an axial tensor. The quadrupole parameter was estimated to be q(69Ga) = 1/2 Qzz = 0.22 MHz. A hyperfine interaction for 69Ga of ...... hiện toàn bộ
Domain Structure of Thick GaN Layers Grown by Hydride Vapor Phase EpitaxySpringer Science and Business Media LLC - Tập 4 - Trang 197-202 - 2020
T. Paskova, E.B. Svedberg, L.D. Madsen, R. Yakimova, I.G. Ivanov, A. Henry, B. Monemar
The crystal structure and surface morphology of hydride vapour phase epitaxy grown thick (12-105 μm) GaN layers have been investigated as a function of growth rate using several structure sensitive techniques like atomic force microscopy (AFM), x-ray diffraction (XRD) in ω-2θ and ω-rocking curve measurements as well as low temperature photoluminescence (PL). PL and XRD measurements reveal rather n...... hiện toàn bộ
Characterization of Be-Implanted GaN Annealed at High TemperaturesSpringer Science and Business Media LLC - Tập 4 - Trang 203-208 - 2020
C. Ronning, K.J. Linthicum, E.P Carlson, P.J. Hartlieb, D.B. Thomson, T. Gehrke, R.F. Davis
Single crystalline (0001) gallium nitride layers were implanted with beryllium and subsequently annealed within the range of 300-1100 °C for 10-60 minutes under a flux of atomic nitrogen obtained using a rf plasma source. The nitrogen flux protected the GaN surface from decomposition in vacuum at high temperatures. SIMS measurements revealed that no long range diffusion of the implanted Be occurre...... hiện toàn bộ
Novel approach to simulation of group-III nitrides growth by MOVPESpringer Science and Business Media LLC - - 1999
S. Yu. Karpov, V. G. Prokofyev, E.V. Yakovlev, Р.А. Талалаев, Yu.N. Makarov
Recent studies revealed specific features of chemical processes occurring on the surface of growing group-III nitrides – extremely low sticking probability of molecular nitrogen, low sticking coefficient and incomplete decomposition of ammonia frequently used as the nitrogen precursor. These features (kinetic by nature) result in the growth process going on under conditions remarkably devi...... hiện toàn bộ
Zirconium Mediated Hydrogen Outdiffusion From p-GaNSpringer Science and Business Media LLC - Tập 5 - Trang 570-576 - 2020
E. Kaminska, A. Piotrowska, A. Barcz, J. Jasinski, M. Zielinski, K. Golaszewska, R.F. Davis, E. Goldys, K. Tomsia
We have shown that Zr-based metallization can effectively remove hydrogen from the p-type GaN subsurface, which eventually leads to the formation of an ohmic contact. As the release of hydrogen starts at ∼900°C, the thermal stability of the contact system is of particular importance. The remarkable thermal behavior of the ZrN/ZrB2 metallization is associated to the microstructure of each individua...... hiện toàn bộ
Phase Separation in wurtzite In1−x−yGaxAlyNSpringer Science and Business Media LLC - Tập 3 - Trang 1-5 - 1998
T. Matsuoka
The wurtzite structure In1−x−yGaxAlyN quaternary system is studied with respect to the unstable region in mixing. The composition in the unstable region is calculated from the free energy of mixing by using the strictly regular solution model. The interaction parameter used in this calculation is obtained by using the delta-lattice-parameter method. Here, the proportionality constant connecting th...... hiện toàn bộ
Nonlinear Optical Characterization of GaN Layers Grown by MOCVD on SapphireSpringer Science and Business Media LLC - Tập 5 - Trang 768-774 - 2020
Ivan M. Tiginyanu, Igor V. Kravetsky, Dimitris Pavlidis, Andreas Eisenbach, Ralf Hildebrandt, Gerd Marowsky, Hans L. Hartnagel
Optical second and third harmonic generation measurements were carried out on GaN layers grown by metalorganic chemical vapor deposition (MOCVD) on sapphire substrates. The measured d33 is 33 times the d11 of quartz. The angular dependence of second-harmonic intensity as well as the measured ratios d33/d15 = −2.02 and d33/d31 =−2.03 confirm the wurzite structure of the studied GaN layers with the ...... hiện toàn bộ
Homo-epitaxial growth on misoriented GaN substrates by MOCVDSpringer Science and Business Media LLC - Tập 5 - Trang 425-431 - 2020
A. R. A. Zauner, J. J. Schermer, W. J. P. van Enckevort, V. Kirilyuk, J. L. Weyher, I. Grzegory, P. R. Hageman, P. K. Larsen
The N-side of GaN single crystals with off-angle orientations of 0°, 2°, and 4° towards the
$$\left[ {10\bar 10} \right]$$
direction was used as a substrate for homo-epitaxial MOCVD growth. The highest misorientation resulted in a reduction of the density of grown hillocks by almost two orders of magnitude as comp...... hiện toàn bộ
GaN Decomposition in AmmoniaSpringer Science and Business Media LLC - Tập 5 - Trang 273-279 - 2020
D. D. Koleske, A. E. Wickenden, R. L. Henry
GaN decomposition is studied as a function of pressure and temperature in mixed NH3 and H2 flows more characteristic of the MOVPE growth environment. As NH3 is substituted for the 6 SLM H2 flow, the GaN decomposition rate at 1000 °C is reduced from 1×1016 cm−2 s−1 (i.e. 9 monolayers/s) in pure H2 to a minimum of 1×1014 cm−2 s−1 at an NH3 density of 1×1019 cm−3. Further increases of the NH3 density...... hiện toàn bộ
UV-Specific (320-365 nm) Digital Camera Based On a 128×128 Focal Plane Array of GaN/AlGaN p-i-n PhotodiodesSpringer Science and Business Media LLC - Tập 5 - Trang 1-12 - 2020
J.D. Brown, J. Boney, J. Matthews, P. Srinivasan, J.F. Schetzina, Thomas Nohava, Wei Yang, Subash Krishnankutty
An ultraviolet-specific (320-365 nm) digital camera based on a 128×128 array of backside-illuminated GaN/AlGaN p-i-n photodiodes has been successfully developed. The diode structure consists of a base n-type layer of AlGaN (~23% Al) followed by undoped and then p-type GaN layers deposited by metal organic vapor phase epitaxy. Double-side polished sapphire wafers serve as transparent substrates. St...... hiện toàn bộ