Characteristic Temperature Estimation for GaN-Based Lasers

Springer Science and Business Media LLC - Tập 4 Số S1 - Trang 548-553 - 1999
Toshio Honda1, Hideo Kawanishi1, Takahiro Sakaguchi2, Fumio Koyama2, Kenichi Iga2
1Department of Electronic Engineering, Kohgakuin University, 2665-1 Nakano-machi, Hachiohji-shi, Tokyo 192-0015, Japan
2Precision and Intelligence Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan

Tóm tắt

We have estimated the characteristic temperature T0 of GaN-based vertical-cavity surface-emitting lasers. The density matrix theory including intraband relaxation broadening has been taken into account. The estimated T0 is about 300 K, which suggests a good temperature characteristic in GaN-based lasers.

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