Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

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Novel conductive transparent tip for low-temperature tunneling-electron luminescence microscopy using tip collection
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena - Tập 15 Số 1 - Trang 32-37 - 1997
Tooru Murashita
Growth of 1.3 μm InGaAsN laser material on GaAs by molecular beam epitaxy
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena - Tập 17 Số 3 - Trang 1272-1275 - 1999
D. E. Mars, D.I. Babic, Y. Kaneko, Ying‐Lan Chang, Sudhir G. Subramanya, Jörg Krüger, P. Perlin, Eicke R. Weber
Low frequency noise in heavily doped polysilicon thin film resistors
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena - Tập 16 Số 4 - Trang 1881-1884 - 1998
M. Jamal Deen, Sergey Rumyantsev, J.H. Orchard-Webb
Nitridation of the GaAs (001) surface using atomic nitrogen
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena - Tập 15 Số 4 - Trang 1133-1138 - 1997
Polly Hill, D. I. Westwood, L. Haworth, Jing‐Tao Lü, J. Emyr Macdonald
Effects of nanoimprinted patterns in tissue-culture polystyrene on cell behavior
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena - Tập 23 Số 6 - Trang 2984-2989 - 2005
Walter Hu, Evelyn K. F. Yim, Ronald M. Reano, Kam W. Leong, S. W. Pang
Electrical characterization for ZnO layers grown on GaN templates by molecular-beam epitaxy
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena - Tập 23 Số 3 - Trang 1281-1285 - 2005
D. C. Oh, Tomoya Suzuki, J. J. Kim, Hisao Makino, Takashi Hanada, M. W. Cho, Takafumi Yao, J. S. Song, H. J. Ko
Energy exchange processes in electron emission at high fields and temperatures
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena - Tập 12 Số 2 - Trang 727-736 - 1994
M. S. Chung, P. H. Cutler, N. M. Miskovsky, T. E. Sullivan
Underwater scanning tunneling microscopy of organic and biological molecules
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena - Tập 9 Số 3 - Trang 1566-1569 - 1991
Jianxun Mou, Wenjun Sun, Junjue Yan, Wenfeng Yang, Cheng Liu, Zhonghe Zhai, Qiang Xu, Youchang Xie
Systematic investigations of nanostructuring by scanning tunneling microscopy
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena - Tập 14 Số 1 - Trang 48-53 - 1996
Rainer Köning, Otto Jusko, Ludger Koenders, A. Schlachetzki
Mechanical properties, stress evolution and high-temperature thermal stability of nanolayered Mo–Si–N/SiC thin films
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena - Tập 17 Số 4 - Trang 1329-1335 - 1999
P. Torri, J. Hirvonen, H. Kung, Yiling Lu, M. Nastasi, P.N. Gibson
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