Surface mobility in silicon at large operating temperature - Trang 15-20
S. Reggiani, A. Valdinoci, L. Colalongo, M. Rudan, G. Baccarani, A. Stricker, F. Illien, N. Felber, W. Fichtner, S. Mettler, S. Lindenkreuz, L. Zullino
#Silicon #Testing #Temperature distribution #Electric breakdown #MOSFET circuits #Temperature control #Manufacturing #Microelectronics #Impurities #Lattices
Self-consistent single-particle simulation - Trang 159-162
F.M. Bufler, C. Zechner, A. Schenk, W. Fichtner
#Modeling #Doping #Monte Carlo methods #MOSFET circuits #Hydrodynamics #Poisson equations #High definition video #Stability #Systems engineering and theory #Couplings