Surface and Interface Analysis
SCIE-ISI SCOPUS (1979-2025)
0142-2421
1096-9918
Anh Quốc
Cơ quản chủ quản: WILEY , John Wiley and Sons Ltd
Lĩnh vực:
Chemistry (miscellaneous)Condensed Matter PhysicsSurfaces and InterfacesMaterials ChemistrySurfaces, Coatings and Films
Các bài báo tiêu biểu
Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids
Tập 1 Số 1 - Trang 2-11 - 1979
AbstractA compilation is presented of all published measurements of electron
inelastic mean free path lengths in solids for energies in the range 0–10 000 eV
above the Fermi level. For analysis, the materials are grouped under one of the
headings: element, inorganic compound, organic compound and adsorbed gas, with
the path lengths each time expressed in nanometers, monolayers and milligrams
per s...
Investigation of multiplet splitting of Fe 2p XPS spectra and bonding in iron compounds
Tập 36 Số 12 - Trang 1564-1574 - 2004
AbstractFerrous (Fe2+) and ferric (Fe3+) compounds were investigated by XPS to
determine the usefulness of calculated multiplet peaks to fit high‐resolution
iron 2p3/2 spectra from high‐spin compounds. The multiplets were found to fit
most spectra well, particularly when contributions attributed to surface peaks
and shake‐up satellites were included. This information was useful for fitting
of the ...
Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range
Tập 21 Số 3 - Trang 165-176 - 1994
AbstractWe report calculations of electron inelastic mean free paths (IMFPs) of
50–2000 eV electrons for a group of 14 organic compounds: 26‐n‐paraffin,
adenine, β‐carotene, bovine plasma albumin, deoxyribonucleic acid,
diphenylhexatriene, guanine, kapton, polyacetylene, poly(butene‐1‐sulfone),
polyethylene, polymethylmethacrylate, polystyrene and poly(2‐vinylpyridine). The
computed IMFPs for thes...
Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis
Tập 3 Số 5 - Trang 211-225 - 1981
AbstractQuantitative information from electron spectroscopy for chemical
analysis requires the use of suitable atomic sensitivity factors. An empirical
set has been developed, based upon data from 135 compounds of 62 elements. Data
upon which the factors are based are intensity ratios of spectral lines with F1s
as a primary standard, value unity, and K2p3/2 as a secondary standard. The data
were o...
X‐ray photoelectron spectroscopic chemical state quantification of mixed nickel metal, oxide and hydroxide systems
Tập 41 Số 4 - Trang 324-332 - 2009
AbstractQuantitative chemical state X‐ray photoelectron spectroscopic analysis
of mixed nickel metal, oxide, hydroxide and oxyhydroxide systems is challenging
due to the complexity of the Ni 2p peak shapes resulting from multiplet
splitting, shake‐up and plasmon loss structures. Quantification of mixed nickel
chemical states and the qualitative determination of low concentrations of
Ni(III) specie...
Calculations of electorn inelastic mean free paths. II. Data for 27 elements over the 50–2000 eV range
Tập 17 Số 13 - Trang 911-926 - 1991
AbstractWe report calculations of electron inelastic mean free paths (IMFPs) for
50–2000 eV electrons in a group of 27 elements (C, Mg, Al, Si, Ti, V, Cr, Fe,
Ni, Cu, Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Ta, W, Re, Os, Ir, Pt, Au and Bi). This
work extends our previous calculations (Surf. Interface Anal. 11, 57 (1988)) for
the 200–2000 eV range. Substantial variations were found in the shapes of the
IMF...
Ce 3d XPS investigation of cerium oxides and mixed cerium oxide (CexTiyOz)
Tập 40 Số 3-4 - Trang 264-267 - 2008
AbstractThis article presents an XPS study of Ce 3d emission spectra dominated
by atomic multiplet effects in core level spectroscopy of rare earth compounds
(Ce oxides). Core level spectroscopy has been used to study the electronic
states of Ce 3d5/2 and Ce 3d3/2 levels in Ce4+ and Ce3+ states. The
well‐resolved components of Ce 3d5/2 and Ce 3d3/2 spin‐orbit components, due to
various final state...
Calculations of electron inelastic mean free paths for 31 materials
Tập 11 Số 11 - Trang 577-589 - 1988
AbstractWe present new calculations of electron inelastic mean free paths
(IMFPs) for 200–2000 eV electrons in 27 elements (C, Mg, Al, Si, Ti, V, Cr, Fe,
Ni, Cu, Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Os, Ir, Pt, Au and Bi) and
four compounds (LiF, SiO2, ZnS and Al2O3). These calculations are based on an
algorithm due to Penn which makes use of experimental optical data (to represent
the de...
Resolving ruthenium: XPS studies of common ruthenium materials
Tập 47 Số 11 - Trang 1072-1079 - 2015
X‐ray photoelectron spectroscopy (XPS) utilising monochromatic Al Kα radiation
has been employed to study metallic ruthenium and the catalytically and
technologically important ruthenium compounds RuO2, RuCl3, Ru(NO)(NO3)3 and
Ru(AcAc)3. The results improve on the accuracy of already published Ru(3d)
binding energies, expand known Ru(3p) binding energies and also report
spin‐orbit splitting for th...
XPS Study of the reduction of cerium dioxide
Tập 20 Số 6 - Trang 508-512 - 1993
AbstractX‐ray photoelectron spectroscopy of cerium oxides is discussed. The
well‐resolved 3d3/2 (5d 6s)0 4f0 2p6 peak at 916.70 eV cannot be used for
calculating the amount of reduction because the correlation between its
intensity and the concentration of Ce(IV) and CE(III) species is not liner. We
have therefore develped a complete anlaysis of the whole spectrum. The
deconvolution procedure is e...