Surface and Interface Analysis
SCIE-ISI SCOPUS (1979-2023)
0142-2421
1096-9918
Anh Quốc
Cơ quản chủ quản: WILEY , John Wiley and Sons Ltd
Lĩnh vực:
Chemistry (miscellaneous)Condensed Matter PhysicsSurfaces and InterfacesMaterials ChemistrySurfaces, Coatings and Films
Các bài báo tiêu biểu
Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsAbstract A compilation is presented of all published measurements of electron inelastic mean free path lengths in solids for energies in the range 0–10 000 eV above the Fermi level. For analysis, the materials are grouped under one of the headings: element, inorganic compound, organic compound and adsorbed gas, with the path lengths each time expressed in nanometers... ...
Tập 1 Số 1 - Trang 2-11 - 1979
Investigation of multiplet splitting of Fe 2p XPS spectra and bonding in iron compoundsAbstract Ferrous (Fe2+ ) and ferric (Fe3+ ) compounds were investigated by XPS to determine the usefulness of calculated multiplet peaks to fit high‐resolution iron 2p3/2 spectra from high‐spin compounds. The multiplets were found to fit most spectra well, particularly when contributions attributed to surf... ...
Tập 36 Số 12 - Trang 1564-1574 - 2004
Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV rangeAbstract We report calculations of electron inelastic mean free paths (IMFPs) of 50–2000 eV electrons for a group of 14 organic compounds: 26‐n ‐paraffin, adenine, β‐carotene, bovine plasma albumin, deoxyribonucleic acid, diphenylhexatriene, guanine, kapton, polyacetylene, poly(butene‐1‐sulfone), polyethylene, polymethylmethacrylate, polyst... ...
Tập 21 Số 3 - Trang 165-176 - 1994
Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysisAbstract Quantitative information from electron spectroscopy for chemical analysis requires the use of suitable atomic sensitivity factors. An empirical set has been developed, based upon data from 135 compounds of 62 elements. Data upon which the factors are based are intensity ratios of spectral lines with F1s as a primary standard, value unity, and K2p3... ...
Tập 3 Số 5 - Trang 211-225 - 1981
X‐ray photoelectron spectroscopic chemical state quantification of mixed nickel metal, oxide and hydroxide systemsAbstract Quantitative chemical state X‐ray photoelectron spectroscopic analysis of mixed nickel metal, oxide, hydroxide and oxyhydroxide systems is challenging due to the complexity of the Ni 2p peak shapes resulting from multiplet splitting, shake‐up and plasmon loss structures. Quantification of mixed nickel chemical states and the qualitative determination of low... ...
Tập 41 Số 4 - Trang 324-332 - 2009
Calculations of electorn inelastic mean free paths. II. Data for 27 elements over the 50–2000 eV rangeAbstract We report calculations of electron inelastic mean free paths (IMFPs) for 50–2000 eV electrons in a group of 27 elements (C, Mg, Al, Si, Ti, V, Cr, Fe, Ni, Cu, Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Ta, W, Re, Os, Ir, Pt, Au and Bi). This work extends our previous calculations (Surf. Interface Anal. 11, 57 (1988)) for the 200–2000 eV range... ...
Tập 17 Số 13 - Trang 911-926 - 1991
Ce 3d XPS investigation of cerium oxides and mixed cerium oxide (CexTiyOz)Abstract This article presents an XPS study of Ce 3d emission spectra dominated by atomic multiplet effects in core level spectroscopy of rare earth compounds (Ce oxides). Core level spectroscopy has been used to study the electronic states of Ce 3d5/2 and Ce 3d3/2 levels in Ce4+ and Ce3+...
Tập 40 Số 3-4 - Trang 264-267 - 2008
Calculations of electron inelastic mean free paths for 31 materialsAbstract We present new calculations of electron inelastic mean free paths (IMFPs) for 200–2000 eV electrons in 27 elements (C, Mg, Al, Si, Ti, V, Cr, Fe, Ni, Cu, Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Os, Ir, Pt, Au and Bi) and four compounds (LiF, SiO2 , ZnS and Al2 O3 ). These calculations are bas... ...
Tập 11 Số 11 - Trang 577-589 - 1988
Resolving ruthenium: XPS studies of common ruthenium materialsX‐ray photoelectron spectroscopy (XPS) utilising monochromatic Al Kα radiation has been employed to study metallic ruthenium and the catalytically and technologically important ruthenium compounds RuO2 , RuCl3 , Ru(NO)(NO3 )3 and Ru(AcAc)3 . The results improve on... ...
Tập 47 Số 11 - Trang 1072-1079 - 2015
XPS Study of the reduction of cerium dioxideAbstract X‐ray photoelectron spectroscopy of cerium oxides is discussed. The well‐resolved 3d3/2 (5d 6s)0 4f0 2p6 peak at 916.70 eV cannot be used for calculating the amount of reduction because the correlation between its intensity and the concentration of Ce(IV) and CE(III) species... ...
Tập 20 Số 6 - Trang 508-512 - 1993