Surface and Interface Analysis

SCIE-ISI SCOPUS (1979-2023)

  0142-2421

  1096-9918

  Anh Quốc

Cơ quản chủ quản:  WILEY , John Wiley and Sons Ltd

Lĩnh vực:
Chemistry (miscellaneous)Condensed Matter PhysicsSurfaces and InterfacesMaterials ChemistrySurfaces, Coatings and Films

Các bài báo tiêu biểu

Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids
Tập 1 Số 1 - Trang 2-11 - 1979
M. P. Seah, W. A. Dench
AbstractA compilation is presented of all published measurements of electron inelastic mean free path lengths in solids for energies in the range 0–10 000 eV above the Fermi level. For analysis, the materials are grouped under one of the headings: element, inorganic compound, organic compound and adsorbed gas, with the path lengths each time expressed in nanometers...... hiện toàn bộ
Investigation of multiplet splitting of Fe 2p XPS spectra and bonding in iron compounds
Tập 36 Số 12 - Trang 1564-1574 - 2004
Andrew P. Grosvenor, Brad Kobe, Mark C. Biesinger, N. S. McIntyre
AbstractFerrous (Fe2+) and ferric (Fe3+) compounds were investigated by XPS to determine the usefulness of calculated multiplet peaks to fit high‐resolution iron 2p3/2 spectra from high‐spin compounds. The multiplets were found to fit most spectra well, particularly when contributions attributed to surf...... hiện toàn bộ
Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range
Tập 21 Số 3 - Trang 165-176 - 1994
Shigeo Tanuma, C. J. Powell, David R. Penn
AbstractWe report calculations of electron inelastic mean free paths (IMFPs) of 50–2000 eV electrons for a group of 14 organic compounds: 26‐n‐paraffin, adenine, β‐carotene, bovine plasma albumin, deoxyribonucleic acid, diphenylhexatriene, guanine, kapton, polyacetylene, poly(butene‐1‐sulfone), polyethylene, polymethylmethacrylate, polyst...... hiện toàn bộ
Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis
Tập 3 Số 5 - Trang 211-225 - 1981
C. D. Wagner, Lawrence E. Davis, M. Zeller, J. Ashley Taylor, R. Raymond, Laird H. Gale
AbstractQuantitative information from electron spectroscopy for chemical analysis requires the use of suitable atomic sensitivity factors. An empirical set has been developed, based upon data from 135 compounds of 62 elements. Data upon which the factors are based are intensity ratios of spectral lines with F1s as a primary standard, value unity, and K2p3...... hiện toàn bộ
X‐ray photoelectron spectroscopic chemical state quantification of mixed nickel metal, oxide and hydroxide systems
Tập 41 Số 4 - Trang 324-332 - 2009
Mark C. Biesinger, Brad P. Payne, Woon‐Ming Lau, Andrea R. Gerson, Roger St. C. Smart
AbstractQuantitative chemical state X‐ray photoelectron spectroscopic analysis of mixed nickel metal, oxide, hydroxide and oxyhydroxide systems is challenging due to the complexity of the Ni 2p peak shapes resulting from multiplet splitting, shake‐up and plasmon loss structures. Quantification of mixed nickel chemical states and the qualitative determination of low...... hiện toàn bộ
Calculations of electorn inelastic mean free paths. II. Data for 27 elements over the 50–2000 eV range
Tập 17 Số 13 - Trang 911-926 - 1991
Shigeo Tanuma, C. J. Powell, David R. Penn
AbstractWe report calculations of electron inelastic mean free paths (IMFPs) for 50–2000 eV electrons in a group of 27 elements (C, Mg, Al, Si, Ti, V, Cr, Fe, Ni, Cu, Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Ta, W, Re, Os, Ir, Pt, Au and Bi). This work extends our previous calculations (Surf. Interface Anal. 11, 57 (1988)) for the 200–2000 eV range...... hiện toàn bộ
Ce 3d XPS investigation of cerium oxides and mixed cerium oxide (CexTiyOz)
Tập 40 Số 3-4 - Trang 264-267 - 2008
E. Bêche, Patrice Charvin, D. Perarnau, Stéphane Abanades, Gilles Flamant
AbstractThis article presents an XPS study of Ce 3d emission spectra dominated by atomic multiplet effects in core level spectroscopy of rare earth compounds (Ce oxides). Core level spectroscopy has been used to study the electronic states of Ce 3d5/2 and Ce 3d3/2 levels in Ce4+ and Ce3+... hiện toàn bộ
Calculations of electron inelastic mean free paths for 31 materials
Tập 11 Số 11 - Trang 577-589 - 1988
Shigeo Tanuma, C. J. Powell, David R. Penn
AbstractWe present new calculations of electron inelastic mean free paths (IMFPs) for 200–2000 eV electrons in 27 elements (C, Mg, Al, Si, Ti, V, Cr, Fe, Ni, Cu, Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Os, Ir, Pt, Au and Bi) and four compounds (LiF, SiO2, ZnS and Al2O3). These calculations are bas...... hiện toàn bộ
Resolving ruthenium: XPS studies of common ruthenium materials
Tập 47 Số 11 - Trang 1072-1079 - 2015
David Morgan
X‐ray photoelectron spectroscopy (XPS) utilising monochromatic Al Kα radiation has been employed to study metallic ruthenium and the catalytically and technologically important ruthenium compounds RuO2, RuCl3, Ru(NO)(NO3)3 and Ru(AcAc)3. The results improve on...... hiện toàn bộ
XPS Study of the reduction of cerium dioxide
Tập 20 Số 6 - Trang 508-512 - 1993
Michelangelo Romeo, Klaudia Bąk, Jaâfar El Fallah, F. Le Normand, L. Hilaire
AbstractX‐ray photoelectron spectroscopy of cerium oxides is discussed. The well‐resolved 3d3/2 (5d 6s)0 4f0 2p6 peak at 916.70 eV cannot be used for calculating the amount of reduction because the correlation between its intensity and the concentration of Ce(IV) and CE(III) species...... hiện toàn bộ