XPS Study of the reduction of cerium dioxide

Surface and Interface Analysis - Tập 20 Số 6 - Trang 508-512 - 1993
Michelangelo Romeo1, Klaudia Bąk1, Jaâfar El Fallah1, F. Le Normand1, L. Hilaire1
1Laboratorie de Catalyse et Chimie des Surfaces, URA 423 du CNRS, Université Louis Pasteur, 4 rue Blaise Pascal, F 67070 Strasbourg Cedex, France

Tóm tắt

AbstractX‐ray photoelectron spectroscopy of cerium oxides is discussed. The well‐resolved 3d3/2 (5d 6s)0 4f0 2p6 peak at 916.70 eV cannot be used for calculating the amount of reduction because the correlation between its intensity and the concentration of Ce(IV) and CE(III) species is not liner. We have therefore develped a complete anlaysis of the whole spectrum. The deconvolution procedure is explained in detail and the method is applied to two examples: a CeO2/Al2O3 sample and a Pd/CeO2 catalyst reduced under hydrogen.

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Surface and Interface Analysis

Tập 20 Số 6

508-512

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