Circular polarization of the photoluminescence from a system of two-dimensional A + centers in a magnetic fieldSemiconductors - Tập 45 - Trang 776-782 - 2011
P. V. Petrov, Yu. L. Ivánov, N. S. Averkiev
A series of GaAs/AlGaAs quantum well structures with different concentrations of
A + centers is studied experimentally by polarized photoluminescence
spectroscopy. The spectral dependences of the circular polarization and the
energy shifts in a magnetic field exhibit qualitatively different behavior for
samples corresponding to the weak and strong localization conditions. The
results obtained are ... hiện toàn bộ
Raman Spectroscopy of GaN Epitaxial Layers Synthesized on Si(111) by Molecular Beam Epitaxy with NitridationSemiconductors - Tập 54 - Trang 1847-1849 - 2021
E. A. Lubyankina, V. V. Toporov, A. M. Mizerov, S. N. Timoshnev, K. Yu. Shubina, B. H. Bairamov, A. D. Bouravleuv
Investigation of GaN epitaxial layers on silicon substrates is driven by high
potential for fabrication of high efficiency and relatively low-cost electronic
devises. Growth process of GaN layers on Si by molecular-beam epitaxy is
complicated by mutual diffusion of Si and Ga and differences in thermal
expansion coefficients and lattice parameters causing large number of defects.
To improve the qua... hiện toàn bộ
Dependence of the electron capture velocity on the quantum-well depth in semiconductor lasersSemiconductors - Tập 50 - Trang 667-670 - 2016
Z. N. Sokolova, K. V. Bakhvalov, A. V. Lyutetskiy, N. A. Pikhtin, I. S. Tarasov, L. V. Asryan
Three laser structures with a single strained InGaAs quantum well of different
depths and a GaAs or Al0.1Ga0.9As waveguide region are grown by metal-organic
chemical vapor deposition. Using the experimentally determined values of the
threshold current density and internal differential quantum efficiency, the
velocity of electron capture into the quantum well is calculated for each of
these structu... hiện toàn bộ
Optical transmittance spectra of insulator nanoparticles in bulk heterocompositesSemiconductors - Tập 43 - Trang 331-339 - 2009
J. N. Kulchin, V. P. Dzyuba, A. V. Shcherbakov
A theoretical model is presented of the visible, near-infrared, and
near-ultraviolet transmittance spectra of arbitrarily-shaped small-sized
insulator particles embedded in an insulator in relation to the particle
dimensions and the radiation frequency. The model is based on a number of
assumptions. In the band gap of the nanoparticles, there are allowed energy
bands produced by surface defects. T... hiện toàn bộ
Magnetic Properties of Thin Epitaxial SiC Layers Grown by the Atom-Substitution Method on Single-Crystal Silicon SurfacesSemiconductors - Tập 55 - Trang 137-145 - 2021
N. T. Bagraev, S. A. Kukushkin, A. V. Osipov, V. V. Romanov, L. E. Klyachkin, A. M. Malyarenko, V. S. Khromov
A cycle of experimental investigations is carried out, specifically, the
measurements and analysis of field dependences of the static magnetic
susceptibility in samples of single-crystal SiC thin films grown on the (100),
(110), and (111) surfaces of a Si single crystal by the method of the
self-consistent substitution of atoms due to the chemical reaction of silicon
with carbon-monoxide (CO) gas.... hiện toàn bộ
Mechanism of electronic-excitation transfer in organic light-emitting devices based on semiconductor quantum dotsSemiconductors - Tập 47 - Trang 971-977 - 2013
A. G. Vitukhnovskii, A. A. Vashchenko, V. S. Lebedev, R. B. Vasiliev, P. N. Brunkov, D. N. Bychkovskii
The results of an experimental study of organic light-emitting diodes (LEDs)
with luminescent layers based on two types of CdSe/CdS semiconductor quantum
dots (QDs) with an average CdSe core diameter of 3 and 5 nm and a characteristic
CdS shell thickness of 0.5 nm are presented. The dependences of the LED
efficiency on the QD concentration are determined. The experimental data are
used to determin... hiện toàn bộ
Growth of n-Si layers by molecular-beam epitaxy on the substrates heavily doped with boronSemiconductors - Tập 43 - Trang 181-184 - 2009
V. G. Shengurov, V. Yu. Chalkov, D. V. Shengurov, S. A. Denisov
Epitaxial n-Si layers doped with phosphorus or erbium have been grown by
sublimation molecularbeam epitaxy at 500°C on heavily boron-doped p +-type
substrates with resistivity ρ = 0.005 Ω cm. Distribution profiles of the B, Er,
and O impurity concentrations in the samples were determined by secondary-ion
mass spectrometry. A thermal annealing of the substrate in vacuum at 1300°C for
10 min and gro... hiện toàn bộ