Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit Tập 14 Số 5 - Trang 469-477 - 2008
C. Kisielowski, Bert Freitag, Maarten Bischoff, Hai-Long Lin, Sorin Lazar, G.M.H. Knippels, Peter Tiemeijer, Michiel van der Stam, S. von Harrach, M Stekelenburg, M. Haider, Stephan Uhlemann, Heiko Müller, Peter Hartel, B. Kabius, Dean J. Miller, I. Petrov, E. A. Olson, T. Donchev, E. A. Kenik, Andrew R. Lupini, J. Bentley, S. J. Pennycook, Ian Anderson, A. M. Minor, Andreas K. Schmid, Thomas Duden, Velimir Radmilović, Quentin M. Ramasse, Masashi Watanabe, Rolf Erni, Eric A. Stach, P. Denes, U. Dahmen