Difference of soft error rates in SOI SRAM induced by various high energy ion speciesElsevier BV - Tập 273 - Trang 262-265 - 2012
Satoshi Abo, Naoyuki Masuda, Fujio Wakaya, Tivadar Lohner, Shinobu Onoda, Takahiro Makino, Toshio Hirao, Takeshi Ohshima, Toshiaki Iwamatsu, Hidekazu Oda, Mikio Takai