Universal Correlations betweenTcandnsm*(Carrier Density over Effective Mass) in High-TcCuprate Superconductors

Physical Review Letters - Tập 62 Số 19 - Trang 2317-2320
Yohei Uemura1, G. M. Luke1, B. J. Sternlieb1, J. H. Brewer2, J. F. Carolan2, W. N. Hardy2, R. Kadono2, J. R. Kempton2, R. F. Kiefl2, S. R. Kreitzman2, P. J. Mulhern2, T. M. Riseman2, D. Ll. Williams2, Bingxin Yang2, Satoshi Uchida3, H. Takagi3, J. Gopalakrishnan4, A.W. Sleight4, M.A. Subramanian4, C. L. Chien5, Marta Z. Cieplak5, Gang Xiao5, V. Y. Lee6, B. W. Statt7, C. E. Stronach8, W. J. Kossler9, Xiaodong Yu9
1Department of Physics, Columbia University, New York, New York 10027
2TRIUMF and Department of Physics, University of British Columbia, Vancouver, British Columbia, Canada V6T2A3
3Engineering Research Institute, Faculty of Engineering, University of Tokyo, Tokyo 113, Japan
4E. I. du Pont de Nemours and Company, Experimental Station, Wilmington, Delaware 19880-0262
5Department of Physics and Astronomy, Johns Hopkins University, Baltimore, Maryland, 21218.
6IBM Almaden Research Center, San Jose, California, 95120
7Department of Physics, University of Toronto, Toronto, Ontario, Canada M3H5T6
8Department of Physics, Virginia State University, Petersburg, Virginia 23803
9College of William and Mary, Williamsburg, Virginia, 23185

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Physical Review Letters

Tập 62 Số 19

2317-2320

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