The use of low temperature X‐ray diffraction to evaluate freezing methods used in freeze‐fracture electron microscopy
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Gulik‐Krzywicki T. Costello M. J. Gadet A.&Fourme R.(1976)The use of low temperature X‐ray diffraction to evaluate freezing methods used in freeze‐fracture electron microscopy Proc. Sixth European Congress on Electron Microscopy Jerusalem Vol. II p.625.
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