Quang hỗ trợ nano lithography quét trên màng Ti
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Valiev, K.A., Lukichev, V.F., and Orlikovsky, A.A., Silicon Nanoelectronics: Challenges and Prospects, Nanotekhnol. Mater., 2005, no. 1, pp. 17–19.
Nanotekhnologii v elektronike (Nanotechnologies in Electronics), Chaplygin, Yu.A., Ed., Moscow: Tekhnosfera, 2005.
Nevolin, V.K., Zondovye tekhnologii v elektronike (Scanning-Probe Technologies in Electronics), Moscow: Tekhnosfera, 2005.
Aseev, A.L., Nanotekhnologii v poluprovodnikovoi elektronike (Nanotechnologies in Semiconductor Electronics), Novosibirsk: SO RAN, 2004.
Bobrinetskii, I.I., Korneev, N.V., and Nevolin, V.K., Charge Transport through Planar Metal Nanotapers, Izv. Vyssh. Uchebn. Zaved., Elektron., 2001, no. 3, pp. 17–21.
Sokolov, D.V., Reproducibility of the Nanoscale Oxidation of n-In0.53Ga0.47As Using an Atomic-Force Microscope, Mikrosist. Tekh., 2001, no. 5, pp. 25–29.
Ageev, O.A., Kolomiitsev, A.S., Polyakov, V.V., Svetlichnyi, A.M., and Smirnov, V.A., Investigation of the Local Anodic Oxidation of a Titanium Film under Stimulation by Ultraviolet Radiation, in Trudy MNK “Tonkie plenki i nanostruktury (PLENKI-2005)” (Proc. Int. Sci. Conf. on Thin Films and Nanostructures, FILMS-2005), Moscow, 2005, vol. 1, pp. 160–163.
Sechenov, D.A., Svetlichnyi, A.M., and Polyakov, V.V., Fotostimulirovannye tekhnologicheskie protsessy v kremnievykh strukturakh (Photoassisted Fabrication Procedures for Silicon Structures), Taganrog: TRTU, 2002.
Kasimov, F.D., Guseinov, Ya.Yu., Svetlichnyi, A.M., Polyakov, V.V., and Kocherov, A.N., Fotostimulirovannye protsessy okisleniya karbida kremniya (Photoassisted Oxidation Processes for Silicon Carbide), Baku: Mutardzhim, 2005.
Song, A.M., Room-Temperature Ballistic Nano-Devices, in Encyclopedia of Nanoscience and Nanotechnology, American Scientific Publishers, 2004, vol. 9, pp. 371–389.
Dubois, E. and Bubbendor, J.-L., Nanometer Scale Lithography on Silicon, Titanium, and PMMA Resist Using Scanning Probe Microscopy, Solid-State Electron., 1999, vol. 43, pp. 1085–1089.