Kinetically controlled critical thickness for coherent islanding and thick highly strained pseudomorphic films ofInxGa1xAs on GaAs(100)

American Physical Society (APS) - Tập 46 Số 15 - Trang 9551-9554
C. W. Snyder1, John F. Mansfield1, B. G. Orr1
1Harrison M. Randall Laboratory of Physics, University of Michigan, Ann Arbor, Michigan 48109-1120

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Tài liệu tham khảo

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