Determination of effective capacitance and film thickness from constant-phase-element parameters

Electrochimica Acta - Tập 55 Số 21 - Trang 6218-6227 - 2010
Bryan Hirschorn1, Mark E. Orazem1, Bernard Tribollet2, Vincent Vivier2, Isabelle Frateur3, Marco Musiani4
1Department of Chemical Engineering University of Florida Gainesville FL 32611 USA
2LISE, UPR 15 du CNRS, Université P. et M. Curie, CP 133, 4 Place Jussieu, 75252 Paris Cedex 05, France
3Laboratoire de Physico-Chimie des Surfaces, UMR CNRS-ENSCP 7045, École Nationale Supérieure de Chimie de Paris, 11 rue Pierre et Marie Curie, 75005 Paris, France
4Istituto per l’Energetica e le Interfasi, IENI - CNR, Corso Stati Uniti 4, 35127 Padova, Italy

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