Design for manufacturability and yield

Maly, 1986, VLSI yield prediction and estimation: a unified framework, IEEE Trans. CAD, 10.1109/TCAD.1986.1270182

Ho, 1984, SUPREM III — A Program for Integrated Circuit Modeling and Simulation

Yu, 1985, SEDAN III — A Generalized Electronic Material Device Analysis Program

Nassif, 1984, FABRICS II: a statistically based IC fabrication process simulator, IEEE Trans. CAD, 10.1109/TCAD.1984.1270055

Box, 1978

Box, 1987

Alvarez, 1988, Application of statistical design and response surface methods to computer-aided VLSI device design, IEEE Trans. CAD of ICAS, vol. 7, 272, 10.1109/43.3158

Strojwas, 1982, Pattern Recognition Based Methods for IC Failure Analysis

Low, 1988, An efficient macromodeling approach for statistical IC process design, 10.1109/ICCAD.1988.122453

Collins, 1989, Semiconductor equipment modeling methodology

Matson, 1986, Macromodeling and optimization of digital MOS VLSI circuits, IEEE Trans. CAD, 10.1109/TCAD.1986.1270236

Nassif, 1986, A Macromodeling Approach for Simulation of VLSI Circuits

Benkoski, 1987, A new approach to hierarchical and statistical timing simulations, IEEE Trans. CAD, 10.1109/TCAD.1987.1270345

Stapper, 1983, Modeling of integrated circuit defect sensitivities, IBM J. Res. Dev., 10.1147/rd.276.0549

Maly, 1983, Yield estimation model for VLSI artwork evaluation, Electronic Lett., 10.1049/el:19830156

Maly, 1985, Modeling of lithography related yield losses for CAD of VLSI circuits, IEEE Trans. CAD, 10.1109/TCAD.1985.1270112

Walker, 1986, VLASIC: a catastrophic fault yield simulator for integrated circuits, IEEE Trans. CAD, 10.1109/TCAD.1986.1270225

Spanos, 1986, Parameter extraction for statistical IC process characterization, IEEE Trans. CAD, 10.1109/TCAD.1986.1270178

Maly, 1987, Double-Bridge Test Structure for the Evaluation of Type, Size and Density of Spot Defects, Technical Report, Carnegie Mellon

Nassif, 1986, A method for worst-case analysis of integrated circuits, IEEE Trans. CAD, 10.1109/TCAD.1986.1270181

Severson, 1987, Hadamard analysis - an effective, systematic tool for worst-case circuit analysis

1987

Singhal, 1981, Statistical design centering and tolerancing using parametric sampling, IEEE Trans. CAS, 10.1109/TCS.1981.1085029

Director, 1977, The simplicial approximation approach to design centering, IEEE Trans. CAS, 10.1109/TCS.1977.1084353

Cox, 1985, Statistical modeling for efficient parametric yield estimation of MOS VLSI circuits, IEEE Trans ED, 10.1109/T-ED.1985.21965

Phadke, 1983, Off-line quality control in integrated circuit fabrication using experimental design, The Bell System Tech. J., 10.1002/j.1538-7305.1983.tb02298.x

Razdan, 1986, A statistical design rule developer, IEEE Trans. CAD, 10.1109/TCAD.1986.1270222

1987

Maly, 1988, Built-in current testing - feasibility study, 10.1109/ICCAD.1988.122524