Micron

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Comparison of manual and automated image analysis techniques for characterization of fission gas pores in irradiated U-Mo fuels
Micron - Tập 119 - Trang 98-108 - 2019
Charlyne A. Smith, Dennis D. Keiser, Brandon D. Miller, Assel Aitkaliyeva
Microscopic characterization of tension wood cell walls of Japanese beech ( Fagus crenata ) treated with ionic liquids
Micron - Tập 88 - Trang 24-29 - 2016
Toru Kanbayashi, Hisashi Miyafuji
Comparative sperm ultrastructure of three species in Siniperca (Teleostei: Perciformes: Sinipercidae)
Micron - Tập 42 - Trang 884-891 - 2011
Du Luo, Ji-Jia Sun, Xue Lu, Ling-Zhi Liu, Shi-Juan Chen, Gui-Feng Li
Simultaneous in situ profiling of DNA lesion endpoints based on image cytometry and a single cell database approach
Micron - Tập 36 - Trang 321-330 - 2005
Philippe Baert, Geert Meesen, Sofie De Schynkel, André Poffijn, Patrick Van Oostveldt
Correlative SEM-Raman microscopy to reveal nanoplastics in complex environments
Micron - Tập 144 - Trang 103034 - 2021
Ruth Schmidt, Manfred Nachtnebel, Martina Dienstleder, Sabrina Mertschnigg, Hartmuth Schroettner, Armin Zankel, Michael Poteser, Hans-Peter Hutter, Wolfgang Eppel, Harald Fitzek
In situ TEM and SEM studies on the antimicrobial activity and prevention of Candida albicans biofilm by Cassia spectabilis extract
Micron - Tập 40 Số 4 - Trang 439-443 - 2009
Epitaxial growth and band alignment of (GdxLa1−x)2O3 films on n-GaAs (001)
Micron - Tập 40 - Trang 114-117 - 2009
Jun-Kyu Yang, Sun Gyu Choi, Hyung-Ho Park
Repetitive DNAs in the slug Milax nigricans: association of ribosomal (18S–28S and 5S rDNA) and (TTAGGG)n telomeric sequences) in the slug M. nigricans (Mollusca: Gastropoda: Pulmonata)
Micron - Tập 35 - Trang 255-260 - 2004
R Vitturi, L Sineo, N Volpe, A Lannino, M Colomba
Microstructure characterization of Al matrix composite reinforced with Ti–6Al–4V meshes after compression by scanning electron microscope and transmission electron microscope
Micron - Tập 43 - Trang 278-284 - 2012
Q. Guo, D.L. Sun, X.L. Han, S.R. Cheng, G.Q. Chen, L.T. Jiang, G.H. Wu
Practical spatial resolution of electron energy loss spectroscopy in aberration corrected scanning transmission electron microscopy
Micron - Tập 42 - Trang 539-546 - 2011
A.B. Shah, Q.M. Ramasse, J.G. Wen, A. Bhattacharya, J.M. Zuo
Tổng số: 1,480   
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