Practical spatial resolution of electron energy loss spectroscopy in aberration corrected scanning transmission electron microscopy

Micron - Tập 42 - Trang 539-546 - 2011
A.B. Shah1,2, Q.M. Ramasse3, J.G. Wen2, A. Bhattacharya4,5, J.M. Zuo1,2
1Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA
2Fredrick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA
3National Center for Electron Microscopy, Lawrence-Berkeley National Laboratory, Berkeley, CA 94720 USA
4Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA
5Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439, USA

Tài liệu tham khảo

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