Use of a channelled image intensifier in the field-ion microscope

IOP Publishing - Tập 2 Số 8 - Trang 731-733 - 1969
Patricia Turner1, P. F. S. Cartwright1, M.J. Southon1, A. van Oostrom2, B.W. Manley3
1Dept. of Metallurgy University of Cambridge
2Philips Research Laboratories, Eindhoven, The Netherlands
3Mullard Research Laboratories, Redhill, Surrey

Tóm tắt

Từ khóa


Tài liệu tham khảo

Adams J, 1966, Adv. Electron. Electron Phys., 22A, 139, 10.1016/S0065-2539(08)61648-0

Adams J, 1965, Electron. Engng., 37, 180

Adams J, 1966, I.E.E.E. Trans. Nucl. Sci., NS-13, 88, 10.1109/TNS.1966.4324084

Adams J, 1967, Philips Tech. Rev., 28, 156

10.1063/1.1683437

10.1063/1.1720565

10.1063/1.1718728

Manley B W, 1969, Advanc. Electron. Phys.

Mullard Ltd, 1963

Wiley W C, 1962, I.R.E. Trans. Nucl. Sci., NS-9, 103, 10.1109/TNS2.1962.4315981