Time-resolved magnetic domain imaging by x-ray photoemission electron microscopy

Applied Physics Letters - Tập 82 Số 14 - Trang 2299-2301 - 2003
J. Vogel1, W. Kuch2, M. Bonfim1, Julio Camarero1, Yan Pennec1, F. Offi2, Keiki Fukumoto2, J. Kirschner2, A. Fontaine1, S. Pizzini1
1Laboratoire Louis Néel, CNRS, Boı̂te Postale 166, F-38042 Grenoble, France
2Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, D-06120 Halle, Germany

Tóm tắt

X-ray photoemission electron microscopy (X–PEEM) is a powerful imaging technique that can be used to perform element selective magnetic domain imaging on heterogeneous samples with different magnetic layers, like spin valves and tunnel junctions. We have performed nanosecond time-resolved X–PEEM measurements, on the permalloy layer of a Ni80Fe20 (5 nm)/Cu (10 nm)/Co (5 nm) trilayer deposited on Si(111). We used the pump-probe mode, synchronizing a magnetic pulse from a microcoil with the x-ray photon bunches delivered by the BESSY synchrotron in single bunch mode. Images could be acquired during and after the 20 ns long and 80 Oe high field pulses. The nucleation and subsequent growth of reversed domains in the permalloy could be observed, demonstrating the feasibility of element selective and time-resolved domain imaging using X–PEEM.

Từ khóa


Tài liệu tham khảo

2001, Phys. Rev. Lett., 86, 728, 10.1103/PhysRevLett.86.728

2001, Phys. Rev. B, 64, 144418, 10.1103/PhysRevB.64.144418

1993, J. Magn. Magn. Mater., 121, 536, 10.1016/0304-8853(93)91263-7

1998, Phys. Rev. B, 58, 11507, 10.1103/PhysRevB.58.11507

2001, Phys. Rev. Lett., 86, 3646, 10.1103/PhysRevLett.86.3646

1998, Surf. Rev. Lett., 5, 1241, 10.1142/S0218625X98001572

1999, J. Phys.: Condens. Matter, 11, 9517

2002, Phys. Rev. B, 65, 064406, 10.1103/PhysRevB.65.064406

1997, J. Electron Spectrosc. Relat. Phenom., 84, 231, 10.1016/S0368-2048(97)00016-9

1997, Appl. Phys. Lett., 71, 3299, 10.1063/1.120318

2000, J. Appl. Phys., 87, 1996, 10.1063/1.372126

2002, J. Vac. Sci. Technol. B, 20, 2543, 10.1116/1.1523371

Thông tin
Thông tin xuất bản

Applied Physics Letters

Tập 82 Số 14

2299-2301

Thông tin tác giả