Thermal nanometrology using piezoresistive SThM probes with metallic tips

Ultramicroscopy - Tập 193 - Trang 104-110 - 2018
Paweł Janus1, Andrzej Sierakowski1, Maciej Rudek2, Piotr Kunicki2, Andrzej Dzierka2, Paweł Biczysko2, Teodor Gotszalk2
1Instytut Technologii Elektronowej, al. Lotników 32/46, Warszawa, Poland
2Wroclaw University of Technology, ul. Janiszewskiego 32/46, Wrocław 50-372, Poland

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