Hirota T, Yamada I, Yakushiji H, Hinoue T, Ono T, Matsumoto H (2010) Fabrication of planarized discrete track media using gas cluster ion beams. IEEE Trans Mag 46:1599–1602
Israelachvili JN (1972) The calculation of van der Waals dispersion forces between macroscopic bodies. Proc Roy Soc Lond Ser A 331:39–55
Israelachvili JN (1992) Intermolecular and surface forces, 2nd edn. Academic Press, USA
Li L, Bogy DB (2011) Dynamics of air bearing sliders flying on partially planarized bit patterned media in hard disk drives. Microsyst Technol 17:805–812
Li N, Zheng L, Meng Y, Bogy DB (2009) Experimental study of head-disk interface flyability and durability at sub-1-nm clearance. IEEE Trans Mag 45:3624–3627
Li J, Xu J, Shimizu Y, Honchi M, Ono K, Kato Y (2010) Design and evaluation of damped air bearings at head-disk interface. J Tribol 132:031702
Lifshitz EM (1956) The theory of molecular attractive forces between solids. Soviet Phys JETP 2:73–83
Matsuoka H, Ohkubo S, Fukui S (2005) Corrected expression of the van der Waals pressure for multilayered system with application to analyses of static characteristics of flying head sliders with an ultrasmall spacing. Microsyst Technol 11:824–829
Matsuoka H, Oka K, Yamashita Y, Saeki F, Fukui S (2011) Deformation characteristics of ultra-thin liquid film considering temperature and film thickness dependence of surface tension. Microsyst Technol 17:983–990
Matsuoka H, Matsuda K, Fukui S (2012) Theoretical model for lubricant pickup considering disjoining pressure of nanometer thick film. IEEE Trans Mag 48:4257–4260
Ninham BW, Parsegian VA (1970) van der Waals forces across triple-layer films. J Chem Phys 52:4578–4587
Prieve DC, Russel WB (1988) Simplified predictions of Hamaker constants from Lifshitz theory. J Colloid Interface Sci 125:1–13
Tabor D, Winterton RHS (1969) The direct measurement of normal and retarded van der Waals forces. Proc Roy Soc Lond Ser A 312:435–450
Yoon Y, Talke FE (2010) Touch-down and take-off hysteresis of magnetic recording sliders on discrete track media. Microsyst Technol 16:273–278