Suppression of drain conductance frequency dispersion in InP-based HEMTs by eliminating hole accumulation

T. Arai1, K. Sawada1, N. Okamoto1, K. Makiyama1, T. Takahashi1, N. Hara1
1Fujitsu Laboratories Limited, Atsugi, Kanagawa, Japan

Tóm tắt

InP-based HEMTs are promising devices for large-capacity optical fiber communication systems. To enable higher bit rate systems, though, drain conductance (g/sub d/) frequency dispersion must be suppressed as it causes jitter, which reduces the size of eye pattern openings in integrated circuits. We propose a planar structure device to remarkably suppress g/sub d/ frequency dispersion by eliminating hole accumulation at the extrinsic source. The band-discontinuity between the source contact and the channel was eliminated by direct ohmic contact, which increased the flow of holes to the source contact.

Từ khóa

#HEMTs #MODFETs #Optical fiber dispersion #Ohmic contacts #Capacitance #Impact ionization #Radio frequency #Laboratories #Optical fiber communication #Bit rate

Tài liệu tham khảo

10.1109/16.735714 10.1109/16.841222 10.1109/16.108182 okamoto, 2001, Tech Dig IEDM, 189 sawada, 2001, Ext Abst SSDM, 66