Study of the charge collection efficiency of CdZnTe radiation detectors

Y. Nemirovsky1, A. Ruzin1, G. Asa1, Julia Gorelik1
1Kidron Microelectronics Research Center, Department of Electrical Engineering, Technion-Israel Institute of Technology, HaIfa, Israel

Tóm tắt

Từ khóa


Tài liệu tham khảo

J.F. Butler,Properties of Narrow Gap Cadmium-based Compounds, ed. P. Capper, emis data reviews series, No.10 (London: INSPEC, 1994), p. 587.

C.J. Johnson, E.E. Eissler, S.E. Cameron, Y. Kong, S. Fan, S. Yovanovic and K.G. Lynn,Mater. Res. Soc. Symp. Proc. 299 (Pittsburgh, PA: Mater. Res. Soc., 1994), p. 215.

eVproducts, div. of II-VI Incorporated, 375 Saxonburg Blvd., Saxonburg, PA 16056.

E. Raiskin and J.F. Butler,IEEE Trans. Nucl. Sci. NS-35,82 (1988).

M. Hage-Ali and P. Siffert,Mater. Res. Soc. Symp. Proc. 299 (Pittsburgh, PA: Mater Res. Soc, 1994), p. 231.

J.F. Butler, F.P. Doty, B. Apotovsky, S.J. Friesenham and C. Lingren,Mater. Res. Soc. Symp. Proc. 299 (Pittsburgh, PA: Mater. Res. Soc, 1994), p. 249.

A. W. Brinkman,Properties of Narrow Gap Cadmium-based Compounds, ed. P. Capper, emis data reviews series, No.10 (London: INSPEC, 1994), p. 575.

J.F. Butler, F.P. Doty and C. Lingren,IEEE Trans, on Nucl. Sci. NS-39, 291 (1993).

A. Ruzin, J. Gorelik and Y. Nemirovsky,Proc. 18th IEEE ConventionElectricalandElectronicsEngineers,Israel, March 1995, Tel Aviv, p. 3.5.2.

Glenn F. Knoll,Radiation Detection and Measurement, 2nd ed. (New York: Wiley, 1989).

F.P. Doty,Properties of Narrow Gap Cadmium-based Compounds, ed. P. Capper, emis data reviews series, No.10 (London: INSPEC, 1994), p. 540.