Stiffness-tolerant methods for transient analysis of stiff Markov chains

Microelectronics Reliability - Tập 34 Số 11 - Trang 1825-1841 - 1994
Manish Malhotra1, Jogesh K. Muppala2, Kishor S. Trivedi3
1Room 2K-312, AT & T Bell Labs, Holmdel, NJ 07733, U.S.A.
2Department of Computer Science, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong
3Department of Electrical Engineering, Duke University, P.O. Box 90291, Durham, NC 27708-0291, U.S.A.

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