Scaling behavior of YBa2Cu3O7−δ thin-film weak links

Applied Physics Letters - Tập 57 Số 11 - Trang 1155-1157 - 1990
S. E. Russek1, D. K. Lathrop1, B. H. Moeckly1, R. A. Buhrman1, Dong Hyuk Shin1, J. Silcox1
1School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853-2501

Tóm tắt

The superconductive weak link properties of microbridges formed in c-axis normal YBa2Cu3O7−δ polycrystalline thin films containing a variable amount of large angle tilt boundaries have been studied. In the low critical current density limit these weak links have current-voltage (I-V) characteristics that are accurately modeled by the resistively shunted junction model. The I-V’s are found to accurately follow a simple scaling law with the product of the critical current and weak link resistance Rn varying linearly with the weak link conductance.

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Tài liệu tham khảo

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Thông tin
Thông tin xuất bản

Applied Physics Letters

Tập 57 Số 11

1155-1157

Thông tin tác giả