Reduction of CdZnTe substrate defects and relation to epitaxial HgCdTe quality
Tóm tắt
Từ khóa
Tài liệu tham khảo
D.R. Rhiger, J.M. Peterson and G.M. Venzor, unpublished (IRIS Materials Mtg., Aug. 1994).
S.M. Johnson, D.R. Rhiger, J.P. Rosbeck, J.M. Peterson, S.M. Taylor and M.E. Boyd,J. Vac. Sci. Technol. B10,1499(1992).
D.R. Rhiger, R.D. Rodriguez and J.M. Peterson, unpublished (IRIS Detector Mtg., Aug. 1991).
S. Sen, S.M. Johnson, J.A. Kiele, W.H. Konkel and J.E. Stannard,Mat. Res. Soc. Symp. Proc. 161, 3 (1990).
H.R. Vydyanath, J. Ellsworth, J.J. Kennedy, B. Dean. C.J. Johnson, G.T. Neugebauer, J. Sepich and P. Liao,J. Vac. Sci. Technol. B 10, 1476 (1992).
H.R. Vydyanath,J.A. Ellsworth,J.B. Parkinson.J.J. Kennedy, B. Dean, C.J. Johnson, G.T. Neugebauer, J. Sepich and P. Liao,J. Electron. Mater. 22, 1073 (1993).
J.P. Tower, S.P. Tobin, P.W. Norton, A.B. Bolong, A. Socha, J.H. Tregilgas, C.K. Ard and H.F. Arlinghaus,J. Electron. Mater. 25, 1183 (1996).
H.F. Arlinghaus, M.T. Spaar, N. Thonnard, A.W. McMahon, T. Tanigaki, H. Shichi and P.H. Holloway,J. Vac. Sci. Technol. A 11, 2317 (1993).
H.F. Arlinghaus, M.T. Spaar, N. Thonnard, A.W. McMahon and K.B. Jacobson,Optical Methods for Ultrasensitive Detection and Analysis: Techniques and Applications, ed. B.L.Fearey, SPIE Proc. 1435, 26 (1991).
H.R. Vydyanath, J.A. Ellsworth, R.F. Fisher, J.J. Kennedy, C.J. Johnson and G.T. Neugebauer,J. Electron. Mater. 22, 1067 (1993).
S. Sen, J.E. Stannard, S.M. Johnson, H.F. Arlinghaus and G.I. Bekov,J. Electron. Mater. 24, 515 (1995).