Radiation damage due to knock-on processes on carbon foils cooled to liquid helium temperature

Ultramicroscopy - Tập 3 - Trang 185-189 - 1978
I. Dietrich1, F. Fox1, H.G. Heide2, E. Knapek1, R. Weyl1
1Forschungslaboratorien der Siemens AG, München, Fed. Rep. Germany
2Institut für Elektronenmikroskopie am Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin, Fed. Rep. Germany

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