Quality factors in micron- and submicron-thick cantilevers

Journal of Microelectromechanical Systems - Tập 9 Số 1 - Trang 117-125 - 2000
Kevin Yasumura1, T. D. Stowe2, Eugene M. Chow2, T. Pfafman3, Thomas W. Kenny2, B. C. Stipe4, D. Rugar4
1Dept. of Applied Phys., Stanford Univ., CA, USA
2[Departments of Applied Physics, Electrical Engineering, and Mechanical Engineering, University of Stanford, Stanford, CA, USA]
3Department of Mechanical Engineering, University of Stanford, Stanford, CA, USA
4IBM Research Division, Almaden Research Center, San Jose, CA, USA

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