On statistics of dielectric strength of triggered vacuum switches

D.F. Alferov1, V.A. Nevrovsky2, V.A. Sidorov1
1Russian Electrotechnical Institute, Moscow, Russia
2Moscow State University of Aircraft Technology (MATI), Moscow, Russia

Tóm tắt

The paper deals with experimental tests of dielectric strength of triggered vacuum switches (TVS). The dielectric strength was measured applying AC high voltage to a switch after several commutations of current in the TVS. Two approaches to determine a breakdown probability curve were used in the tests. Taking into account practical considerations, the main body of experimental results was obtained at the low probability end of the curve.

Từ khóa

#Statistics #Dielectric breakdown #Switches #Testing #Breakdown voltage #Electric breakdown #Electrodes #Current measurement #Dielectric measurements #Tail

Tài liệu tham khảo

kapur, 1977, Reliability in Engineering Design 10.1023/A:1014273929990 10.1023/A:1004185017662 steel, 1970, Proc IEE, 117, 1337