Nonequilibrium 1/f noise and problems of submicron technology of high reliability microcircuits
ICCSC'02. 1st IEEE International Conference on Circuits and Systems for Communications. Proceedings (IEEE Cat. No.02EX605) - Trang 400-403
Tóm tắt
A proposition is put forward that nonequilibrium fluctuations of reactive energy (electric and magnetic) in crystal areas are causing deterioration of the reliability of elements due to the decrease in their sizes. We assume that those fluctuations and the known 1/f noise are same. The lowest frequency of 1/f fluctuations of energy is defined by the microcircuit operating duration. Inevitably the moment will come when the intensity of this fluctuation will exceed a critical (destructive) level in crystal structures. This fact explains the known interrelation of nonequilibrium fluctuations and the reliability of electronic devices. The proof is based on analysis of steady-state electric processes by methods of both statistical physics and nonequilibrium thermodynamics. We show that nonequilibrium fluctuations lowers the reliability of microcircuits as the degree of miniaturization grows.
Từ khóa
#Fluctuations #Equations #Frequency #Magnetic noise #Circuit testing #Physics #Thermodynamics #Reactive power #Parasitic capacitance #VoltageTài liệu tham khảo
10.1016/0378-4363(76)90089-9
balim, 2001, The Estimation of the Time of Non-Failure Operation of Semiconductor Both Devices and Microcircuits at the Expected Level of the Flicker Noise, HEI Transactions The Electronics, 43
10.1103/PhysRev.106.620
landau, 1976, Journal of Statistical Physics
10.1103/PhysRev.32.110
buckingham, 1983, Noise in Electronic Devices and Systems
kopyl, 1969, The Connection of Transistors Reliability with Low Frequency Spectrum of Noises, HEI Transactions The Radio engineering, 12, 1222
bellman, 1965, Applied Problems of Dynamic Programming
zubarev, 1971, Nonequilibrium Statistical Thermodynamics
balim, 2001, The Method of a Priori Estimation of Intensity of Both Flicker Noise and Factors of Hardware Reliability, Telecommunications N1, 23
pontryagin, 1976, Mathematical Theory of Optimum Processes
popov, 1998, The Fundamentals of Circuitry, 575