New modification of X-ray standing waves above the surface of layered substrates under total external reflection conditions for structural characterization of organic layers

Thin Solid Films - Tập 232 Số 2 - Trang 252-255 - 1993
S. I. Zheludeva1, M. V. Kovalchuk1, Н. Н. Новикова1, A.N. Sosphenov1, N. E. Malysheva1, Н. Н. Салащенко2, A. D. Akhsakhalyan2, Yuriy Y. Platonov2
1A.V. Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninsky pr. 59, Moscow 117333 Russian Federation
2Institute of Applied Physics, Russian Academy of Sciences, Ulyanov Str. 46, N. Novgorod 603600 Russian Federation

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Born, 1975

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Thin Solid Films

Tập 232 Số 2

252-255

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