Monitoring chemical reactions at a liquid–solid interface: Water on CuIn(S,Se)2 thin film solar cell absorbers

Journal of Chemical Physics - Tập 119 Số 20 - Trang 10467-10470 - 2003
Clemens Heske1, U. Groh1, O. Fuchs1, L. Weinhardt1, E. Umbach1, Th. Schedel‐Niedrig2, Ch.‐H. Fischer2, Martha Ch. Lux‐Steiner2, S. Zweigart3, T. P. Niesen3, F. Karg3, Jonathan D. Denlinger4, B. Rude4, C.W. Andrus5, Forbes R. Powell5
1Experimentelle Physik II, Universität Würzburg, Am Hubland, D-97074 Würzburg, Germany
2Hahn-Meitner-Institut, Glienicker Str. 100, D-14109 Berlin, Germany
3Shell Solar GmbH, D-81739 München, Germany
4Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720
5Luxel Corporation, Friday Harbor, Washington 98250

Tóm tắt

The chemical and electronic structure of the interface between liquid water and a CuIn(S,Se)2 thin film surface was studied with synchrotron-based, high energy-resolution soft x-ray emission spectroscopy (XES). By probing the local environment around the sulfur atoms, an x-ray-induced sulfate formation at the CuIn(S,Se)2 surface can be monitored, correlated with a substantial enhancement of sodium impurity atoms from the CuIn(S,Se)2 film and its glass substrate. The results demonstrate that, with XES, an experimental probe is available to in situ study chemical reactions at liquid–solid interfaces or at surfaces in a high-pressure gas environment in a chemically sensitive and atom-specific way.

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