Microprocessor device reliability
Tài liệu tham khảo
Hnatek, 1975, 4-kilobit memories present a challenge to testing, Comput. Des.
Colbourne, 1974, Reliability of MOS LSI circuits
Palfi, 1975, MOS memory system reliability
Hnatek, 1976, An introduction to microprocessor testing problems and test methods