Mechanical properties of thin films from the load deflection of long clamped plates

Journal of Microelectromechanical Systems - Tập 7 Số 3 - Trang 320-328 - 1998
V. Ziebart1, Oliver Paul2, U. Münch1, J. Schwizer1, H. Baltes1
1Physical Electronics Laboratory, ETH Zurich, Zurich, Switzerland
2Institute for Microsystem Technology, University of Freiburg, Freiburg im Breisgau, Germany

Tóm tắt

Từ khóa


Tài liệu tham khảo

10.1109/SENSOR.1997.613619

wu, 1992, stress in psg and nitride films as related to film properties and annealing, Solid State Technol, 35, 65

10.1109/84.557530

landau, 1986, Theory of Elasticity, 14

10.1557/JMR.1992.3242

timoshenko, 1987, Theory of Plates and Shells

10.1149/1.2069141

so¨derkvist, 1994, characteristics of quasibuckling, Sens Mater, 6, 293

timoshenko, 1961, Theory of Elastic Stability

choi, 1997, improved analysis of microbeams under mechanical and electrostratic loads, J Micromech Microeng, 7, 24, 10.1088/0960-1317/7/1/005

tabata, 1994, poisson's ratio evaluation of thin film for sensor application, Tech Dig 12th Sensor Symp, 19

ziebart, 1998, a novel method to measure poisson's ratio of thin films, Proc MRS Symp

maier-schneider, 1995, influence of annealing on elastic properties of lpcvd silicon nitride and lpcvd polysilicon, Sens Mater, 7, 121

10.1109/84.475551

10.1557/PROC-356-221

10.1007/978-3-7091-6619-2_1

10.1088/0960-1317/6/4/011

jaeggi, 1996, CMOS thermal converters, 82

10.1557/PROC-239-257

10.1557/PROC-308-159

10.1557/PROC-356-579

10.1090/psapm/001/0030434

10.1109/MEMSYS.1994.555621

vlassak, 1994, New experimental techniques and analysis methods for the study of the mechanical properties of materials in small volumes

10.1109/SOLSEN.1990.109836

tabata, 1990, control of internal stress and young's modulus of si<formula><tex>$_3$</tex></formula>n<formula><tex>$_4$</tex></formula> and polycrystalline silicon thin films using the ion implantation technique, Appl Phys Lett, 56, 1314, 10.1063/1.103199

timoshenko, 1987, Theory of Plates and Shells

10.1016/0250-6874(89)87111-2

stewart, 1991, young's modulus and residual stress of lpcvd silicon nitride determined from membrane deflection, Sens Mater, 2, 285

yu, 1990, correlation between processing, composition, and mechanical properties of pecvd-sin<formula><tex>$_x$</tex></formula> thin films, Proc MRS Symp, 188, 79, 10.1557/PROC-188-79

10.1116/1.582744

10.1088/0960-1317/2/3/011

beams, 1959, mechanical properties of thin films of gold and silver, Structure and Properties of Thin Films, 183

10.1063/1.98460

10.1109/SOLSEN.1990.109823

10.1109/SOLSEN.1988.26439

mehregany, 1986, the use of micromachined structures for the measurement of mechanical properties and adhesion of thin films, IEEE Solid-State Sensors Workshop, 58

10.1557/PROC-188-41

10.1088/0960-1317/3/4/020

10.1557/PROC-308-115