R.K. Brayton, S.W. Director and G.D. Hatchel, Yield maximization and worst-case design with arbitrary statistical distributions, IEEE Transactions on Circuits and Systems CAS-27(9) (1980) 756–764.
S.W. Director, P. Feldmann and K. Krishna, Optimization of parametric yield: a tutorial, International Journal of High Speed Electronics 3(1) (1992) 95–136.
G. Kjellstrom and L. Taxén, Stochastic optimization in system design, IEEE Transactions on Circuits and Systems CAS-28(7) (1981) 702–715.
D. Kontsoyiannis and T. Xanthopoulos, On the parametric approach to unit hydrograph identification, Water Resources Management 3 (1989) 107–128.
P. Kumaraswamy, A generalized probability density function for double-bounded random processes, Journal of Hydrology 46 (1980) 79–88.
M.S. Lobo, L. Vandenberghe and S. Boyd, Second-order cone programming, Working Paper, Information Systems Laboratory, Electrical Engineering Department, Stanford University, Stanford, CA 94305 (1997).
H.O.Madsen, S. Krenk and N.C. Lind, Methods of Structural Safety (Prentice-Hall, Englewood Cliffs, NJ, 1986).
A. Seifi, K. Ponnambalam and J. Vlach, Probabilistic design of integrated circuits with correlated input parameters, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 18(8) (1999) 1214–1219.
A. Seifi, K. Ponnambalam and J. Vlach, A unified approach to statistical design centering of integrated circuits with correlated parameters, IEEE Transactions on Circuits and Systems I 46(1) (1999) 190–196.
L. Vandenberghe and S. Boyd, Semidefinite programming, SIAM Review 38(1) (1996) 49–95.
J.Wojciechowski, J. Vlach and L. Opalski, Design for non-symmetrical statistical distributions, IEEE Transactions on Circuits and Systems I 44(1) (1997) 29–37.