Investigation of the kinetics of crystallisation of Al/a-Ge bilayer by electrical conductivity measurement

Thin Solid Films - Tập 317 - Trang 34-38 - 1998
I. Kovács1, P. Harmat1, A. Sulyok1, G. Radnóczi1
1Research Institute for Technical Physics of the Hungarian Academy of Sciences, PO Box 76, H-1325 Budapest, Hungary

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