Interface microstructure effects in Au thermosonic ball bonding contacts by high reliability wire materials

Microelectronics Reliability - Tập 54 - Trang 2000-2005 - 2014
B. März1, A. Graff1, R. Klengel1, M. Petzold1
1Fraunhofer Institute for Mechanics of Materials IWM, Center for Applied Microstructure Diagnostics, Walter-Huelse-Strasse 1, 06120 Halle, Germany

Tài liệu tham khảo

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