Inspection challenges of leadless packages

R. Bertz1, P. Leahy2
1New Berlin, WI, USA
2Silicon Laboratories, Inc., Austin, TX, USA

Tóm tắt

The advantages of leadless devices are many, but along with the new technology come new inspection challenges. This paper explores the post-singulation inspection challenges related to the implementation of leadless packages from the perspective of a user implementing a new packaging technology, as well as that of a supplier of inspection tools working to address unique challenges inherent in the package design. Inspection challenges to be reviewed include coplanarity, pad integrity, board quality, package sides and mark inspection.

Từ khóa

#Inspection #Semiconductor device packaging #Lead compounds #Packaging machines #Manufacturing processes #Testing #Assembly #Costs #Performance evaluation #Surface-mount technology