Field extraction from near field scanning for a microstrip structure

2002 IEEE International Symposium on Electromagnetic Compatibility - Tập 2 - Trang 589-592 vol.2
Lin Zhang1, K.P. Slattery2,3, Chen Wang1, M. Yamaguchi2,4, K.-I. Arai2,4, R.E. DuBroff1, J.L. Drewnial5, D. Pommerenke1, T. Hubing1
1Department of Electrical and Computer Engineering, University of Missouri-Rolla, Rolla, MO, USA
2Electromagnetic Compatibility Laboratory, Department of Electrical and Computer Engineering, University of Missouri, Rolla, Rolla, MO, USA
3Intel Desktop Architecture Lab, Hillsboro, OR, USA
4Research Institute of Electrical Communication (RIEC), Tohoku University Sendai, Sendai, Japan
5Department of Electrical and Computer Engineering, University of Missouri-Rolla, Rolla, MO

Tóm tắt

Currents associated with high-speed digital devices have significant impacts on EMI problems in VLSI design and operation. In this paper, a simple transmission line model was implemented as an initial step to represent the EMI mechanisms associated with an IC package. Numerical modeling results were compared with near field scanning measurements and show that the magnetic field deduced from the measurements agrees well with the numerical predictions.

Từ khóa

#Microstrip #Numerical models #Magnetic field measurement #Finite difference methods #Time domain analysis #Integrated circuit modeling #Predictive models #Transmission line measurements #Frequency measurement #Coordinate measuring machines

Tài liệu tham khảo

2000, Measurement of Radiated Emissions from ICs Surface Scan Method pozar, 1998, Microwave Engineering 10.1109/ISEMC.1992.626105
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2002 IEEE International Symposium on Electromagnetic Compatibility

Tập 2

589-592 vol.2

Thông tin tác giả