Extraction of Process-Structure Evolution Linkages from X-ray Scattering Measurements Using Dimensionality Reduction and Time Series Analysis

David B. Brough1, Abhiram Kannan2, Benjamin Haaland3, David G. Bucknall2, Surya R. Kalidindi1,2,4
1School of Computational Science and Engineering, Georgia Institute of Technology, Atlanta, USA
2School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, USA
3H. Milton Stewart School of Industrial & Systems Engineering, Georgia Institute of Technology, Atlanta, USA
4George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, USA

Tóm tắt

The rapid development of robust, reliable, and reduced-order process-structure evolution linkages that take into account hierarchical structure are essential to expedite the development and manufacturing of new materials. Towards this end, this paper lays a theoretical framework that injects the established time series analysis into the recently developed materials knowledge systems (MKS) framework. This new framework is first presented and then demonstrated on an ensemble dataset obtained using small-angle X-ray scattering on semi-crystalline linear low density polyethylene films from a synchrotron X-ray scattering experiment.

Tài liệu tham khảo

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