Elementary scattering theory of the Si MOSFET

IEEE Electron Device Letters - Tập 18 Số 7 - Trang 361-363 - 1997
Mark Lundstrom1
1Department of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA

Tóm tắt

Từ khóa


Tài liệu tham khảo

10.1016/0038-1101(94)90004-3

10.1016/S0080-8784(08)60267-7

10.1109/16.464415

10.1063/1.360946

10.1109/T-ED.1985.22021

10.1109/16.543021

10.1063/1.336432

10.1016/0038-1101(86)90061-4

10.1016/B978-0-12-234118-2.50005-X

10.1016/0038-1101(93)90185-S

10.1109/55.225584

10.1109/55.6947

johnson, 1973, the insulated-gate field-effect transistor—a bipolar transistor in disguise, RCA Rev, 34, 80

10.1109/T-ED.1966.15702

10.1103/PhysRev.123.51

landauer, 1957, conductance as a consequence of incident flux, IBM J Res Develop, 1, 223, 10.1147/rd.13.0223

10.1109/55.6946

chou, 1985, observation of electron velocity overshoot in sub-100-nm-channel mosfet's in silicon, IEEE Electron Device Letters, 6, 665, 10.1109/EDL.1985.26267

10.1017/CBO9780511805776