Electronic transport and noise in nanoelectronic ballistic N/sup +/-i-N/sup +/ diodes

G. Gomila1, I.R. Cantalapiedra2, T. Gonzalez, L. Reggiani3
1Research Center for Bioelectronics and Nanobioscience, Universitat de Barcelona, Spain
2Departament de Física Aplicada, Universitat Politecnica de Catalunya, Barcelona, Spain
3INFM National Nanotechnology Laboratory, Universita di Lecce, Lecce, Italy

Tóm tắt

We present a fully analytical theory for the modeling of the electronic transport and noise properties of ballistic n/sup +/-i-n/sup +/ nanodiodes. The theory includes in a general way the effects of the Pauli exclusion principle and of the long range coulomb interaction. By means of the theory we explore the variety of behaviors exhibited by the current-voltage and the current noise properties for different device parameters (sample length, contact doping). Monte Carlo simulations are used to corroborate the theoretical predictions.

Từ khóa

#Semiconductor device noise #Semiconductor diodes #Nanoscale devices #Semiconductor materials #MOSFETs #Performance analysis #Voltage #FETs #Nanobioscience #Nanotechnology

Tài liệu tham khảo

10.1103/PhysRevLett.60.1406 10.1103/PhysRevB.35.6373 10.1109/16.641349 10.1063/1.357263 gomila, 2002, Phys Rev B to appear 10.1063/1.373011 10.1103/PhysRevLett.55.2071 10.1103/PhysRevLett.55.2200