Electronic transport and noise in nanoelectronic ballistic N/sup +/-i-N/sup +/ diodes
Proceedings of the 2nd IEEE Conference on Nanotechnology - Trang 235-238
Tóm tắt
We present a fully analytical theory for the modeling of the electronic transport and noise properties of ballistic n/sup +/-i-n/sup +/ nanodiodes. The theory includes in a general way the effects of the Pauli exclusion principle and of the long range coulomb interaction. By means of the theory we explore the variety of behaviors exhibited by the current-voltage and the current noise properties for different device parameters (sample length, contact doping). Monte Carlo simulations are used to corroborate the theoretical predictions.
Từ khóa
#Semiconductor device noise #Semiconductor diodes #Nanoscale devices #Semiconductor materials #MOSFETs #Performance analysis #Voltage #FETs #Nanobioscience #NanotechnologyTài liệu tham khảo
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