Arai T, 1977, IEEE Trans. Instrum. Meas., IM-26, 148, 10.1109/TIM.1977.4314515
Benadda M D, 1982, J. Phys. E: Sci. Instrum., 15, 132, 10.1088/0022-3735/15/1/026
Blair D P, 1975, J. Phys. E: Sci. Instrum., 8, 621, 10.1088/0022-3735/8/8/001
Cheredov A I, 1984, Instrum. Exp. Tech., 27, 1186
Corney A C, 1979, IEEE Trans. Instrum. Meas., IM-28, 211, 10.1109/TIM.1979.4314807
Cutkosky R D, 1985, IEEE Trans. Instrum. Meas., IM-34, 383, 10.1109/TIM.1985.4315355
Ewen J A, 1985, Radio Commun., 61, 260
Floyed R E, 1985, IBM Tech. Disclosure Bull., 27, 5449
Green R G, 1983, Measurement, 1, 110, 10.1016/0263-2241(83)90005-2
Hagiwara N, 1983, Electr. Engng. Japan, 13, 123, 10.1002/eej.4391030417
Heerens W C, 1986, J. Phys. E: Sci. Instrum., 19, 897, 10.1088/0022-3735/19/11/002
Hugill A L, 1982, J. Phys. E: Sci. Instrum., 15, 597, 10.1088/0022-3735/15/6/001
Ichijo B A, 1953, J. Appl. Phys., 24, 307, 10.1063/1.1721270
Jagtap V, 1981, Electronics, 54, 136
Jones R V, 1973, J. Phys. E: Sci. Instrum., 6, 589, 10.1088/0022-3735/6/7/001
Kanno M, 1980, Oyo Buturi (Japan), 49, 905
Kanno M, 1978, IEEE Trans. Instrum. Meas., IM-27, 405, 10.1109/TIM.1978.4314724
Kraus K, 1980, Electron. Engng., 52, 23
Masuda Y, 1980, IEEE Trans. Instrum. Meas., IM-29, 28, 10.1109/TIM.1980.4314857
Masumoto H, 1986, IEEE Trans. Instrum. Meas., IM-35, 555, 10.1109/TIM.1986.6831769
Meade M L, 1982, J. Phys. E: Sci. Instrum., 15, 395, 10.1088/0022-3735/15/4/001
Pyle R E, 1979, Electronics, 52, 168
Rahman M, 1984, IEEE Trans. Instrum. Meas., IM-33, 252, 10.1109/TIM.1984.4315219
Richards J C S, 1982, J. Phys. E: Sci. Instrum., 15, 1251, 10.1088/0022-3735/15/12/001
Seeberger R, 1986, IEEE Electr. Insulation, 2, 27, 10.1109/MEI.1986.290561
Wang W H, 1977, Electronics, 50, 127
Watanabe K, 1984, IEEE Trans. Instrum. Meas., IM-33, 247, 10.1109/TIM.1984.4315218
